In the exploration of new energy sources and the search for a path to sustainable\ndevelopment the reliable operation of wind turbines is of great importance to the stability of\npower systems. To ensure the stable and reliable operation of the Insulated Gate Bipolar Transistor\n(IGBT) power module, in this work the influence of changes with aging of different electro-thermal\nparameters on the junction temperature and the case temperature was studied. Firstly, power thermal\ncycling tests were performed on the IGBT power module, and the I-V characteristic curve, switching\nloss and transient thermal impedance are recorded every 1000 power cycles, and then the electrical\nparameters (saturation voltage drop and switching loss) and the thermal parameters (junction-to-case\nthermal resistance) of the IGBT are obtained under different aging states. The obtained electro-thermal\nparameters are substituted into the established electro-thermal coupling model to obtain the junction\ntemperature and the case temperature under different aging states. The degrees of influence of\nthese electro-thermal parameters on the junction temperature and case temperature under different\naging states are analyzed by the single variable method. The results show that the changes of the\nelectro-thermal parameters under different aging states affects the junction temperature and the case\ntemperature as follows: (1) Compared with other parameters, the transient thermal impedance has the\ngreatest influence on the junction temperature, which is 60.1%. (2) Compared with other parameters,\nthe switching loss has the greatest influence on the case temperature, which is 79.8%. The result\nprovides a novel method for the junction temperature calculation model and lays a foundation\nfor evaluating the aging state by using the case temperature, which has important theoretical and\npractical significance for the stable operation of power electronic systems.
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